Webelectrical properties at the nanoscale using Scanning Microwave Impedance Microscopy (sMIM). In APS March Meeting. 33. Friedman, S., & Amster, O. (2014). Imaging and quantification of electrical properties at the nanoscale using Scanning Microwave Impedance Microscopy (sMIM). In APS March Meeting. 34. WebUsing scaled model measurements at 2.5–12 GHz the embedding network of a 3 mm Schottky diode mixer has been developed. The noise performance of a cryogenic …

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Electrical Scanning Probe Microscopy NIST

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